Parallelism allows to perform wafer-level testing on up to 1,152 devices at once.
Advantest Corporation introduced a high-throughput memory tester for NAND flash devices that can perform functional testing of chips while delivering accurate timing, repeatability and failure detection.
T5221 test station (left) and test controller (right)
With data-transfer speeds that are more than 5x faster than its predecessor, the T5221 system is designed to improve production efficiencies while reducing test costs for wafer sorting, built-in self-testing (BIST) and wafer-level burn-in (WLBI).
WW sales of NAND wafer test equipment for multi-stacked type probers are approximately $100 million per year, accounting for an estimated 7% of the total memory market. As the market grows, customers are shifting away from high-functionality wafer-sorting test equipment toward more cost-effective design-for-test (DFT) and BIST strategies using multi-probe systems.
The T5221 is optimized for use with a multi-wafer prober. The system controller can simultaneously manage up to 12 test stations, each with independent testing capabilities. The combined-array architecture reduces test times while the tester’s massive parallelism allows it to perform wafer-level testing on up to 1,152 devices at once.
The system’s test stations do not add to the overall footprint because they are housed within the multi-wafer prober. This allows the platform to use less floor space than firm’s previous nonvolatile memory tester and a standalone prober.
This tester can be docked with either a 12-stage multi-wafer prober for use in mass production or single- or dual-wafer probers in engineering environments.
Probe card design has been simplified to lower the cost of ownership and test. The unit incorporates a combined performance board that eliminates the need for a printed circuit board on the probe card.
System features include 2 driver pins and 1 I/O pin for each device under test as well as a flexible algorithmic pattern generator (ALPG), a waveform generator and various self-diagnostic functions.
To enhance the T5221’s performance range, an optional upgrade is available to boost the power-supply level as high as 28V while still measuring small currents down to 1 nanoampere (nA). These capabilities are not available in many competitive products.
There is a ‘green’ element to this tester. The environmentally design eliminates the use of toxic substances in separating and disassembling the system’s parts.
The T5221’s operation is compatible with the company’s legacy memory solutions to provide users with a seamless transition from previous gens of equipment.
“The launch of our T5221 platform fits with Advantest’s strategy to offer new advantages in the NAND wafer-level test market,” said Masayuki Suzuki, EVP, memory test business unit. “With this system’s advanced performance hardware and high-speed data-transfer capabilities, we can reduce test time and costs compared to competitive products.“